X-ray diffraction (XRD) is essential for nanomaterial characterization, revealing atomic structures and phases through precise diffraction pattern analysis.

In this article, we explore how X-ray diffraction, also known as XRD, can be used to analyze thin films and the benefits of using this technique.

In this article, Thermo Fisher demonstrates how to conduct the quantitative analysis of C3S M1/M3 polymorphs in CEM cement analysis through X-ray Diffraction (XRD).

Cement accounts for 8% of global carbon dioxide emissions, as such reducing the carbon footprint of cement is an area of great interest. XRD analysis is very useful in this decarbonization for a ...